성명 | 최리노 (Rino Choi) |
위치 | 5N 333 |
전화 | 032-860-7529 |
팩스 | 032-862-5546 |
이메일 | rino.choi@inha.ac.kr |
연구분야
- CMOS scaling issues
- Development of technologies for monolithic 3D integration (M3D)
- Enhancement of thermal stability of conventional technologies
- Low temperature processes using lasers
- Electrical characterization and reliability evaluation
- Reliability assessment such as BTI, TDDB and HCI to diagnose devices and guarantee 10-year lifetime
- Development of novel reliability test methodologies for advanced devices
- Exploration of novel devices for next generation applications
- Fabrications of future devices for nonvolatile memory applications and their electrical analysis for commercialization
- Researches of ferroelectric random access memory (FeRAM) using high-k dielectric material for process simplicity